Topics

IEEE Design and Diagnostics of Electronic Circuits and Systems symposium covers the areas of design and testing of electronic components, both digital and analog. These are the topics of the symposium:

  • SoC and NoC Design and Test
  • ASIC and FPGA Design
  • Built-in Self-Test and Self-Repair
  • Bio-Inspired Hardware
  • Design Verification/Validation
  • Formal Methods in System Design
  • Hardware/Software Co-Design
  • IP-based Design
  • Logic Synthesis
  • Defect/Fault Tolerance and Reliability
  • Design and Test in Nano-Technologies
  • Analog, Mixed-Signal, RF Design and Test
  • ATE Hardware and Software
  • Design for Testability and Diagnosis
  • On-line Testing
  • Embedded Systems
  • Memory, Processor Testing
  • MEMS Testing
  • Physical Design
  • Cyber Physical Systems